Abstract
This experiment involves depositing a silver film on a glass substrate and transforming it into a silver sulfide film with memristor characteristics using chemical vapor deposition (CVD) techniques. We used scanning electron microscopy (SEM) and X-ray diffraction (XRD) to examine the film's surface growth quality and crystal structure. Measurements of the current-voltage (I-V) characteristics showed that Ag2S films exhibit memristive effects and can form n-Ag2S/p-silicon diodes. Ongoing photoconductivity measurements indicate that the sample demonstrates good performance under specific frequency conditions.
Cite asLin, J. X. (2024). Synthesis and Electrical Analysis of Silver Sulfide Thin Films. In Abstracts of the 7th World Conference on Advanced Materials, Nanoscience and Nanotechnology and 7th World Conference on Chemistry and Chemical Engineering (ISBN 978-81-981590-9-0). Eurasia Conferences. https://doi.org/10.62422/978-81-981590-9-0-012